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Improvement of production efficiencyImprovement of labor productivityManufacture of high value-added productsTwin illuminationSubtraction methodHigh accuracyHigh speedOn-lineSurface flawsFlaw detection

Surface Flaws

Twin-Illumination Type High Accuracy Surface Inspection System for Flaw Detection

JFE's "twin-illumination and subtraction technique" enables high-accuracy on-line detection of pits and other open surface flaws!

Solution Point

Features 01

Expected Problems
・Aren't you bothered by overlooked flaws and miss-detection due to the difficulty of distinguishing flaws from the surface pattern?
・Doesn't visual inspections place a heavy work load on the operators?
・Isn't management/sharing of flaw position information time- and labor-intensive work?

Features 02

Technology highlight
・Utilizes the fact that the surface pattern area is flat, while dents and other surface flaws are concave/convex.
・Photography is performed while alternately illuminating light from 2 directions ("twin illumination") at high speed.
・Possible to emphasize and detect only concave/convex flaws with a large shadow difference by image subtraction processing.
・Flaw information is digitized by on-line automatic detection.
図

Features 03

Proposed Solutions (Examples)
・Integrated supply of detection mechanism/control system to existing production lines where surface inspection of steel strips, etc. is necessary.
*Because this technology has been optimized as a system, it is difficult to sell the component functions separately.